Visualizing the interior of semiconductors and electronic components! Ultrasonic diagnostic device for detecting defects.
Evaluate the interior of semiconductors non-destructively and non-contact using ultrasound! 【Space-saving and low-cost】
The ultrasonic C-SCAN imaging diagnostic device "InsightScan IS-350" is a non-destructive evaluation device for the interior of semiconductors using ultrasound. With a new high-speed, high-resolution scanning system, it enables the detection of minute defects with a minimum movement of 0.5μm in each axis, combined with a super-fast A/D conversion board. It can also support high frequencies of up to 500MHz as an option. *For more details, please contact us or download the catalog to view.
- Company：インサイト
- Price：Other
